Event 

Title:
International Conference on Microelectronic Test Structures (ICMTS 2010)
Website:
http://www.if.t.u-tokyo.ac.jp/ICMTS10/
Map of Event:
International Conference on Microelectronic Test Structures (ICMTS 2010) : View Mapanimated gifs
When:
22 Mar 2010 - 25 Mar 2010
Where:
Hiroshima International Convention Center -

Description

The ICMTS 2010 organizing committee is proud to hold the 23rd International Conference on Microelectronic Test Structures (ICMTS). The purpose of conference is to bring together designers and users of test structures to discuss recent developments and future directions.

The conference will be held at the International Conference Center Hiroshima, Japan on March 22-25, 2010. The conference will be preceded by a one-day Tutorial Short Course on Microelectronic Test Structures on March 22, 2010. There will be an equipment exhibition relating to test structure measurements. A Best Paper award will be presented by the Technical Program Committee. 

Venue

Venue:
Hiroshima International Convention Center   -   Website
State:
Hiroshima Prefecture
Country:
Country: jp

Description

The International Conference Center Hiroshima, starting with the Phoenix Hall with its 1,500-person capacity and incorporating an international conference hall as well as large and small conference rooms is a truly international convention center. 

This facility is suitable for a wide range of purposes from hosting conferences to which foreign dignitaries have been invited to academic conferences and other types of events. In addition it is fitted with a variety of the latest equipment including simultaneous translating equipment. 

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